UNE-EN 60749-3:2003

Semiconductor devices - Mechanical and climatic test methods - Part 3: External visual examination

STANDARD published on 30.5.2003

English -
electronic design (pdf) (38.30 USD)

English -

Print design (42.20 USD)

Spanish -

electronic design (pdf) (31.90 USD)

Spanish -

Print design (35.20 USD)

The information about the standard:

Designation standards: UNE-EN 60749-3:2003
Note: WITHDRAWN
Publication date standards: 30.5.2003
The number of pages: 14
Approximate weight : 42 g (0.09 lbs)
Country: Spanish technical standard
Category: Technical standards UNE