Semiconductor devices - Mechanical and climatic test methods -- Part 35: Acoustic microscopy for plastic encapsulated electronic components (IEC 60749-35:2006) (Endorsed by AENOR in January of 2007.)
STANDARD published on 1.1.2007
Designation standards: UNE-EN 60749-35:2006
Publication date standards: 1.1.2007
The number of pages: 25
Approximate weight : 75 g (0.17 lbs)
Country: Spanish technical standard
Category: Technical standards UNE