Semiconductor devices - Mechanical and climatic test methods -- Part 37: Board level drop test method using an accelerometer (Endorsed by AENOR in July of 2008.)
STANDARD published on 17.11.2025
Designation standards: UNE-EN 60749-37:2008
Note: WITHDRAWN
Publication date standards: 17.11.2025
The number of pages: 23
Approximate weight : 69 g (0.15 lbs)
Country: Spanish technical standard
Category: Technical standards UNE