Semiconductor devices- Mechanical and climatic test methods- Part 38: Soft error test method for semiconductor devices with memory (Endorsed by AENOR in September of 2008.)
STANDARD published on 1.9.2008
Designation standards: UNE-EN 60749-38:2008
Publication date standards: 1.9.2008
The number of pages: 16
Approximate weight : 48 g (0.11 lbs)
Country: Spanish technical standard
Category: Technical standards UNE