UNE-EN 60749-4:2003

Semiconductor devices - Mechanical and climatic test methods - Part 4: Damp heat, steady state, highly accelerated stress test (HAST)

STANDARD published on 30.5.2003

English -
electronic design (pdf) (70.20 USD)

English -

Print design (77.20 USD)

Spanish -

electronic design (pdf) (58.50 USD)

Spanish -

Print design (64.30 USD)

The information about the standard:

Designation standards: UNE-EN 60749-4:2003
Note: WITHDRAWN
Publication date standards: 30.5.2003
The number of pages: 22
Approximate weight : 66 g (0.15 lbs)
Country: Spanish technical standard
Category: Technical standards UNE