Semiconductor devices - Mechanical and climatic test methods - Part 40: Board level drop test method using a strain gauge (Endorsed by AENOR in November of 2011.)
STANDARD published on 1.11.2011
Designation standards: UNE-EN 60749-40:2011
Publication date standards: 1.11.2011
The number of pages: 26
Approximate weight : 78 g (0.17 lbs)
Country: Spanish technical standard
Category: Technical standards UNE