Semiconductor devices - Mechanical and climatic test methods - Part 43: Guidelines for IC reliability qualification plans (Endorsed by Asociación Espanola de Normalización in October of 2017.)
STANDARD published on 10.10.2024
Designation standards: UNE-EN 60749-43:2017
Note: WITHDRAWN
Publication date standards: 10.10.2024
The number of pages: 46
Approximate weight : 138 g (0.30 lbs)
Country: Spanish technical standard
Category: Technical standards UNE