
Semiconductor devices - Mechanical and climatic test methods - Part 5: Steady-state temperature humidity bias life test (Endorsed by Asociación Espanola de Normalización in August of 2017.)
STANDARD published on 1.8.2017
Designation standards: UNE-EN 60749-5:2017
Publication date standards: 1.8.2017
The number of pages: 19
Approximate weight : 57 g (0.13 lbs)
Country: Spanish technical standard
Category: Technical standards UNE