UNE-EN 60749-6:2003

Semiconductor devices - Mechanical and climatic test methods - Part 6: Storage at high temperature

STANDARD published on 30.5.2003

English -
electronic design (pdf) (48.00 USD)

English -

Print design (52.80 USD)

Spanish -

electronic design (pdf) (40.00 USD)

Spanish -

Print design (43.90 USD)

The information about the standard:

Designation standards: UNE-EN 60749-6:2003
Note: WITHDRAWN
Publication date standards: 30.5.2003
The number of pages: 15
Approximate weight : 45 g (0.10 lbs)
Country: Spanish technical standard
Category: Technical standards UNE