Semiconductor devices - Mechanical and climatic test methods - Part 7: Internal moisture content measurement and the analysis of other residual gases (Endorsed by AENOR in December of 2011.)
STANDARD published on 1.12.2011
Designation standards: UNE-EN 60749-7:2011
Publication date standards: 1.12.2011
The number of pages: 14
Approximate weight : 42 g (0.09 lbs)
Country: Spanish technical standard
Category: Technical standards UNE