Semiconductor devices - Micro-electromechanical devices - Part 14: Forming limit measuring method of metallic film materials (Endorsed by AENOR in June of 2012.)
STANDARD published on 1.6.2012
Designation standards: UNE-EN 62047-14:2012
Publication date standards: 1.6.2012
The number of pages: 21
Approximate weight : 63 g (0.14 lbs)
Country: Spanish technical standard
Category: Technical standards UNE