Semiconductor devices - Micro-electromechanical devices - Part 18: Bend testing methods of thin film materials (Endorsed by AENOR in November of 2013.)
STANDARD published on 1.11.2013
Designation standards: UNE-EN 62047-18:2013
Publication date standards: 1.11.2013
The number of pages: 17
Approximate weight : 51 g (0.11 lbs)
Country: Spanish technical standard
Category: Technical standards UNE