UNE-EN 62047-2:2006

Semiconductor devices - Micro-electromechanical devices -- Part 2: Tensile testing method of thin film materials (IEC 62047-2:2006). (Endorsed by AENOR in January of 2007.)

STANDARD published on 1.1.2007

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Print design (73.60 USD)

The information about the standard:

Designation standards: UNE-EN 62047-2:2006
Publication date standards: 1.1.2007
The number of pages: 17
Approximate weight : 51 g (0.11 lbs)
Country: Spanish technical standard
Category: Technical standards UNE