UNE-EN 62047-3:2006

Semiconductor devices - Micro-electromechanical devices -- Part 3: Thin film standard test piece for tensile testing (IEC 62047-3:2006) (Endorsed by AENOR in January of 2007.)

STANDARD published on 1.1.2007

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The information about the standard:

Designation standards: UNE-EN 62047-3:2006
Publication date standards: 1.1.2007
The number of pages: 12
Approximate weight : 36 g (0.08 lbs)
Country: Spanish technical standard
Category: Technical standards UNE