UNE-EN 62047-6:2010

Semiconductor devices - Micro-electromechanical devices -- Part 6: Axial fatigue testing methods of thin film materials (Endorsed by AENOR in June of 2010.)

STANDARD published on 1.6.2010

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The information about the standard:

Designation standards: UNE-EN 62047-6:2010
Publication date standards: 1.6.2010
The number of pages: 19
Approximate weight : 57 g (0.13 lbs)
Country: Spanish technical standard
Category: Technical standards UNE