Semiconductor devices - Micro-electromechanical devices - Part 8: Strip bending test method for tensile property measurement of thin films (Endorsed by AENOR in September of 2011.)
STANDARD published on 1.9.2011
Designation standards: UNE-EN 62047-8:2011
Publication date standards: 1.9.2011
The number of pages: 21
Approximate weight : 63 g (0.14 lbs)
Country: Spanish technical standard
Category: Technical standards UNE