UNE-EN 62373:2006

Bias-temperature stability test for metal-oxide, semiconductor, field-effect transistors (MOSFET) (IEC 62373:2006). (Endorsed by AENOR in November of 2006.)

STANDARD published on 1.11.2006

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The information about the standard:

Designation standards: UNE-EN 62373:2006
Publication date standards: 1.11.2006
The number of pages: 17
Approximate weight : 51 g (0.11 lbs)
Country: Spanish technical standard
Category: Technical standards UNE