UNE-EN 62374-1:2010

Semiconductor devices -- Part 1: Time-dependent dielectric breakdown (TDDB) test for inter-metal layers (Endorsed by AENOR in March of 2011.)

STANDARD published on 1.3.2011

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The information about the standard:

Designation standards: UNE-EN 62374-1:2010
Publication date standards: 1.3.2011
The number of pages: 19
Approximate weight : 57 g (0.13 lbs)
Country: Spanish technical standard
Category: Technical standards UNE