UNE-EN 62374:2007

Semiconductor devices - Time Dependent Dielectric Breakdown (TDDB) test for gate dielectric films (IEC 62374:2007). (Endorsed by AENOR in February of 2008.)

STANDARD published on 1.11.2013

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The information about the standard:

Designation standards: UNE-EN 62374:2007
Note: WITHDRAWN
Publication date standards: 1.11.2013
The number of pages: 25
Approximate weight : 75 g (0.17 lbs)
Country: Spanish technical standard
Category: Technical standards UNE