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UNE-EN 62415:2010

Semiconductor devices - Constant current electromigration test (Endorsed by AENOR in September of 2010.)

STANDARD published on 1.9.2010

English -
electronic design (pdf) (61.60 USD)
English -
Print design (67.80 USD)

The information about the standard:

Designation standards: UNE-EN 62415:2010
Publication date standards: 1.9.2010
The number of pages: 14
Approximate weight : 42 g (0.09 lbs)
Country: Spanish technical standard
Category: Technical standards UNE