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UNE-EN 62418:2010

Semiconductor devices - Metallization stress void test (Endorsed by AENOR in October of 2010.)

STANDARD published on 1.10.2010

English -
electronic design (pdf) (74.20 USD)
English -
Print design (81.70 USD)

The information about the standard:

Designation standards: UNE-EN 62418:2010
Publication date standards: 1.10.2010
The number of pages: 20
Approximate weight : 60 g (0.13 lbs)
Country: Spanish technical standard
Category: Technical standards UNE