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UNE-EN IEC 60749-17:2019

Semiconductor devices - Mechanical and climatic test methods - Part 17: Neutron irradiation (Endorsed by Asociación Espanola de Normalización in June of 2019.)

STANDARD published on 1.6.2019

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The information about the standard:

Designation standards: UNE-EN IEC 60749-17:2019
Publication date standards: 1.6.2019
The number of pages: 17
Approximate weight : 51 g (0.11 lbs)
Country: Spanish technical standard
Category: Technical standards UNE