
Semiconductor devices - Mechanical and climatic test methods - Part 17: Neutron irradiation (Endorsed by Asociación Espanola de Normalización in June of 2019.)
STANDARD published on 1.6.2019
Designation standards: UNE-EN IEC 60749-17:2019
Publication date standards: 1.6.2019
The number of pages: 17
Approximate weight : 51 g (0.11 lbs)
Country: Spanish technical standard
Category: Technical standards UNE