UNE-EN IEC 60749-18:2019

Semiconductor devices - Mechanical and climatic test methods - Part 18: Ionizing radiation (total dose) (Endorsed by Asociación Espanola de Normalización in July of 2019.)

STANDARD published on 1.7.2019

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The information about the standard:

Designation standards: UNE-EN IEC 60749-18:2019
Publication date standards: 1.7.2019
The number of pages: 29
Approximate weight : 87 g (0.19 lbs)
Country: Spanish technical standard
Category: Technical standards UNE