UNE-EN IEC 60749-23:2026

Semiconductor devices - Mechanical and climatic test methods - Part 23: High temperature operating life (Endorsed by Asociación Espanola de Normalización in March of 2026.)

STANDARD published on 1.3.2026

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The information about the standard:

Designation standards: UNE-EN IEC 60749-23:2026
Publication date standards: 1.3.2026
The number of pages: 17
Approximate weight : 51 g (0.11 lbs)
Country: Spanish technical standard
Category: Technical standards UNE