UNE-EN IEC 60749-28:2022

Semiconductor devices - Mechanical and climatic test methods - Part 28: Electrostatic discharge (ESD) sensitivity testing - Charged device model (CDM) - device level (Endorsed by Asociación Espanola de Normalización in May of 2022.)

STANDARD published on 1.5.2022

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The information about the standard:

Designation standards: UNE-EN IEC 60749-28:2022
Publication date standards: 1.5.2022
The number of pages: 57
Approximate weight : 171 g (0.38 lbs)
Country: Spanish technical standard
Category: Technical standards UNE