UNE-EN IEC 60749-37:2022

Semiconductor devices - Mechanical and climatic test methods - Part 37: Board level drop test method using an accelerometer (Endorsed by Asociación Espanola de Normalización in January of 2023.)

STANDARD published on 1.1.2023

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The information about the standard:

Designation standards: UNE-EN IEC 60749-37:2022
Publication date standards: 1.1.2023
The number of pages: 29
Approximate weight : 87 g (0.19 lbs)
Country: Spanish technical standard
Category: Technical standards UNE