UNE-EN IEC 60749-41:2020

Semiconductor devices - Mechanical and climatic test methods - Part 41: Standard reliability testing methods of non-volatile memory devices (Endorsed by Asociación Espanola de Normalización in October of 2020.)

STANDARD published on 1.10.2020

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The information about the standard:

Designation standards: UNE-EN IEC 60749-41:2020
Publication date standards: 1.10.2020
The number of pages: 29
Approximate weight : 87 g (0.19 lbs)
Country: Spanish technical standard
Category: Technical standards UNE