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IEEE 1505.1-2019
IEEE Approved Draft Standard for the Common Test Interface Pin Map Configuration for High-Density, Single-Tier Electronics Test Requirements Utilizing IEEE Std 1505
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STANDARD published on 11.9.2019
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The information about the standard:
Designation standards: IEEE 1505.1-2019
Publication date standards: 11.9.2019
SKU: NS-953162
Approximate weight : 300 g (0.66 lbs)
Country: International technical standard
Annotation of standard text IEEE 1505.1-2019 :
Revision Standard - Active.
This standard represents an extension to the IEEE 1505 receiver fixture interface (RFI) standard specification. Particular emphasis is placed on defining within the IEEE 1505 RFI standard a more specific set of performance requirements that employ a common scalable: (a) pin map configuration; (b) specific connector modules; (c) respective contacts; (d) recommended switching implementation; and (e) legacy automatic test equipment (ATE) transitional devices. This is intentionally done to standardize the footprint and assure mechanical and electrical interoperability between past and future automatic test systems (ATS).
ISBN: 978-1-5044-5787-3, 978-1-5044-5787-3
Number of Pages: 157
Product Code: STDUD23670, STDAPE23670
Keywords: ATE, ATS, fixture, ICD, interface, ITA, mass termination, receiver, scalable, TPS, UUT
Category: Instrument/Measurement/Testing|Test Instrumentation and Techniques
Draft Number: P1505.1/D6, Apr 2019 - UNAPPROVED DRAFT, P1505.1/D6, Apr 2019 - APPROVED DRAFT
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