IEEE 1181-1991

IEEE Recommended Practice for Latchup Test Methods for CMOS and BiCMOS Integrated- Circuit Process Characterization

STANDARD published on 13.12.1991

English -
electronic (protected pdf) - Immediate download (199.00 USD)

The information about the standard:

Designation standards: IEEE 1181-1991
Note: WITHDRAWN
Publication date standards: 13.12.1991
Approximate weight : 300 g (0.66 lbs)
Country: International technical standard
Category: Technical standards IEEE