IEEE Standard for Terminology and Test Methods for Analog-to-Digital Converters
STANDARD published on 6.10.2023
Designation standards: IEEE 1241-2023
Publication date standards: 6.10.2023
The number of pages: 143
Approximate weight : 460 g (1.01 lbs)
Country: International technical standard
Category: Technical standards IEEE
Revision Standard - Active.
The material presented in this standard is intended to provide common terminology and test methods for the testing and evaluation of analog-to-digital converters (ADCs). This standard considers only those ADCs whose output values are extracted (sampled) and then digitized at known time intervals. In general, this quantization is assumed to be nominally uniform (the input-output transfer curve is approximately a straight line) and the sampling is assumed to be at a nominally uniform rate. Some but not all of the test methods in this standard can be used for ADCs that are designed for non-uniform quantization.
ISBN: 978-1-5044-9690-2, 978-1-5044-9691-9
Number of Pages: 143
Product Code: STD26370, STDPD26370
Keywords: ADC, analog-to-digital converter, code transition level, coherent sampling, DNL, ENOB, histogram, IEEE 1241™, INL, LSB, missing codes, noise power ratio, noncoherent sampling, quantization error, quantization noise, SAR, SFDR, sine fitting
Category: Measurement Instruments and Techniques