IEEE Standard for Extensions to Standard Test Interface Language (STIL) for Semiconductor Design Environments

The information about the standard:

Designation standards: IEEE 1450.1-2025
Publication date standards: 26.6.2025
The number of pages: 141
Approximate weight : 454 g (1.00 lbs)
Country: International technical standard
Category: Technical standards IEEE

Annotation of standard text IEEE 1450.1-2025 :

Revision Standard - Active.
An interface between digital test generation tools and test equipment is provided by Standard Test Interface Language (STIL). Extensions to the test interface language (contained in this standard) are defined that facilitate the use of the language in the design environment and facilitate the use of the language for large designs encompassing subdesigns with reusable patterns.

ISBN: 979-8-8557-1473-9, 979-8-8557-2140-9, 979-8-8557-2141-6
Number of Pages: 141
Product Code: STDAPE27495, STD27889, STDPD27889
Keywords: advanced scan architecture, core, environment, fail feedback, IEEE 1450.1, lockstep, parallel patterns, parameterized data, pattern tiling, pragma, signal variable, SoC, system on chip, test protocol
Category: Test Technology
Draft Number: P1450.1/D3, Oct 2024 - APPROVED DRAFT