IEEE 1450-2023

Annotation of standard text IEEE 1450-2023 :

Revision Standard - Active.
Standard test interface language (STIL) provides an interface between digital test generation tools and test equipment. A test description language is defined in this standard that: (a) facilitates the transfer of digital test vector data from CAE to ATE environments; (b) specifies pattern, format, and timing information sufficient to define the application of digital test vectors to a DUT; and (c) supports the volume of test vector data generated from structured tests.

ISBN: 979-8-8557-0629-1, 979-8-8557-0630-7
Number of Pages: 147
Product Code: STD26865, STDPD26865
Keywords: automatic test pattern generator, ATPG, BIST, built-in self-test, CAE, computer-aided engineering, cyclize, device under test, digital test vectors, DUT, event, functional vectors, IEEE 1450™, pattern, scan vectors, signal, structural vectors, timed event, waveform, waveshape
Category: Test Technology