IEEE 1505.1-2008

IEEE Standard for the Common Test Interface Pin Map Configuration for High-Density, Single-Tier Electronics Test Requirements Utilizing IEEE Std 1505

STANDARD published on 1.8.2013

English -
electronic (protected pdf) - Immediate download (174.00 USD)

The information about the standard:

Designation standards: IEEE 1505.1-2008
Note: WITHDRAWN
Publication date standards: 1.8.2013
Approximate weight : 300 g (0.66 lbs)
Country: International technical standard
Category: Technical standards IEEE