IEEE 1620-2004

Standard for Test Methods for the Characterization of Organic Transistors and Materials

STANDARD published on 29.4.2004

English -
electronic (protected pdf) - Immediate download (141.00 USD)

The information about the standard:

Designation standards: IEEE 1620-2004
Note: WITHDRAWN
Publication date standards: 29.4.2004
Approximate weight : 300 g (0.66 lbs)
Country: International technical standard
Category: Technical standards IEEE