IEEE 1620-2008

IEEE Standard for Test Methods for the Characterization of Organic Transistors and Materials

STANDARD published on 5.12.2008

English -
electronic (protected pdf) - Immediate download (97.00 USD)

The information about the standard:

Designation standards: IEEE 1620-2008
Note: WITHDRAWN
Publication date standards: 5.12.2008
Approximate weight : 300 g (0.66 lbs)
Country: International technical standard
Category: Technical standards IEEE