IEEE 300-1988

IEEE Standard Test Procedures for Semiconductor Charged-Particle Detectors

STANDARD published on 29.12.1988

English -
electronic (protected pdf) - Immediate download (188.00 USD)

The information about the standard:

Designation standards: IEEE 300-1988
Note: WITHDRAWN
Publication date standards: 29.12.1988
Approximate weight : 300 g (0.66 lbs)
Country: International technical standard
Category: Technical standards IEEE