IEEE C62.35-2010/Cor 1-2018

IEEE Standard Test Methods for Avalanche Junction Semiconductor Surge-Protective Device Components--Corrigendum 1

STANDARD published on 12.12.2018

English -
electronic (protected pdf) - Immediate download (1.00 USD)

The information about the standard:

Designation standards: IEEE C62.35-2010/Cor 1-2018
Note: WITHDRAWN
Publication date standards: 12.12.2018
Approximate weight : 300 g (0.66 lbs)
Country: International technical standard
Category: Technical standards IEEE