IEEE Approved Draft Standard for Analog Defect Modeling and Coverage
STANDARD published on 9.12.2025
Designation standards: IEEE P2427
Publication date standards: 9.12.2025
Approximate weight : 300 g (0.66 lbs)
Country: International technical standard
Category: Technical standards IEEE
New IEEE Standard - Active - Draft.
This standard defines a defect coverage accounting method based on simulation models for defects observed within integrated circuits (ICs). The portion of a defect universe, comprising thousands or millions of reasonably likely defects, that is detected or “covered” by tests of analog and mixed-signal circuits depends on many factors, which this standard considers, such as detectability, process variations, defect characteristics, and redundancy. The contents of a defect coverage summary are specified, and dozens of commonly used terms are clearly defined, to aid communication about the quality of tested ICs
ISBN: 979-8-8557-2362-5, 979-8-8557-2362-5
Number of Pages: 108
Product Code: STDUD28057, STDAPE28057
Keywords: defect coverage, analog test coverage, design for test (DFT), analog/mixed-signal (AMS) test, defective parts per million (DPPM)
Category: Test Instrumentation and Techniques|Test Technology
Draft Number: P2427/D0.42, June 2025 - UNAPPROVED DRAFT, P2427/D0.42, June 2025 - APPROVED DRAFT