IEEE/IEC 62525-2007

Annotation of standard text IEEE/IEC 62525-2007 :

New IEEE Standard - Active.
Standard Test Interface Language (STIL) provides an interface between digital test generation
tools and test equipment. A test description language is defined that: (a) facilitates the transfer
of digital test vector data from CAE to ATE environments; (b) specifies pattern, format, and
timing information sufficient to define the application of digital test vectors to a DUT; and (c) supports
the volume of test vector data generated from structured tests.

ISBN: 2-8318-9337-2
Number of Pages: 143
Product Code: STD95740
Keywords: automatic test pattern generator (ATPG), built-in self-test (BIST), computer-aided engineering
(CAE), cyclize, device under test (DUT), digital test vectors, event, functional vectors, pattern, scan vectors, signal, structural vectors, timed event, waveform, waveshape
Category: Test Technology