IEC 62526 Ed. 1 (IEEE Std 1450.1(TM)-2005): Standard for Extensions to Standard Test Interface Language (STIL) for Semiconductor Design Environments

The information about the standard:

Designation standards: IEEE/IEC 62526-2007
Publication date standards: 9.12.2007
Approximate weight : 300 g (0.66 lbs)
Country: International technical standard
Category: Technical standards IEEE

Annotation of standard text IEEE/IEC 62526-2007 :

New IEEE Standard - Active.
Standard Test Interface Language (STIL) provides an interface between digital test
generation tools and test equipment. Extensions to the test interface language (contained in this
standard) are defined that (1) facilitate the use of the language in the design environment and
(2) facilitate the use of the language for large designs encompassing subdesigns with reusable
patterns.

ISBN: 9-7807-3815-7221
Number of Pages: 128
Product Code: STD95741
Keywords: advanced scan architecture, core, environment, fail feedback, lockstep, parallel
patterns, parameterized data, pattern tiling, pragma, signal variable, system on chip (SoC), test
protocol
Category: Test Instrumentation and Techniques