IEC 62528 Ed. 1 (IEEE Std 1500(TM)-2005): Standard Testability Method for Embedded Core-based Integrated Circuits
STANDARD published on 9.12.2007
Designation standards: IEEE/IEC 62528-2007
Note: WITHDRAWN
Publication date standards: 9.12.2007
Approximate weight : 300 g (0.66 lbs)
Country: International technical standard
Category: Technical standards IEEE