IEEE Approved Draft Standard for Static Component Interconnection Test Protocol and Architecture
STANDARD published on 10.3.2026
Designation standards: IEEE/IEC P1581
Publication date standards: 10.3.2026
Approximate weight : 300 g (0.66 lbs)
Country: International technical standard
Category: Technical standards IEEE
Revision Standard - Active - Draft.
IEEE Std 1581 defines a low-cost method for testing the interconnection of discrete, complex memory integrated circuits (ICs) where additional pins for testing are not available and implementing boundary scan (IEEE Std 1149.1™) is not feasible. This standard describes the implementation rules for the test logic and test mode access/exit methods in conformant ICs. The standard is limited to the behavioral description of the implementation and will not include the technical design for the test logic or test mode control circuitry.
ISBN: 979-8-8557-2624-4, 979-8-8557-2624-4
Number of Pages: 122
Product Code: STDUD28262, STDAPE28262
Keywords: board test, connectivity test, IEEE 1581, integrated circuit, interconnect test, interconnection test, memory device, test logic, test mode, transparent test mode
Category: Test Technology
Draft Number: P1581/D2.22, Aug 2025 - UNAPPROVED DRAFT, P1581/D2.22, Aug 2025 - APPROVED DRAFT