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ASTM F1151-88(1998) Historical

Standard Test Method for Determining Variations in Hardness of Film Ribbon Pancakes

WITHDRAWN published on 10.2.1998

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77.00 USD


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ASTM F1151-88(2003) Historical

Standard Test Method for Determining Variations in Hardness of Film Ribbon Pancakes

WITHDRAWN published on 27.5.1988

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77.00 USD


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ASTM F1151-88(2008) Historical

Standard Test Method for Determining Variations in Hardness of Film Ribbon Pancakes (Withdrawn 2015)

WITHDRAWN published on 1.7.2008

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77.00 USD


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ASTM F1152-02 Historical

Standard Test Method for Dimensions of Notches on Silicon Wafers (Withdrawn 2003)

WITHDRAWN published on 10.1.2002

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77.00 USD


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ASTM F1152-93 Historical

Standard Test Method for Dimensions of Notches on Silicon Wafers

WITHDRAWN published on 10.1.2002

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77.00 USD


IN STOCK
ASTM F1152-93(2001) Historical

Standard Test Method for Dimensions of Notches on Silicon Wafers

WITHDRAWN published on 10.1.2002

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77.00 USD


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ASTM F1153-92(1997) Historical

Standard Test Method for Characterization of Metal-Oxide-Silicon (MOS) Structures by Capacitance-Voltage Measurements

WITHDRAWN published on 1.1.1992

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86.00 USD


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ASTM F1153-92(2002) Historical

Standard Test Method for Characterization of Metal-Oxide-Silicon (MOS) Structures by Capacitance-Voltage Measurements (Withdrawn 2003)

WITHDRAWN published on 15.5.1992

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86.00 USD


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ASTM F1154-10 Historical

Standard Practices for Qualitatively Evaluating the Comfort, Fit, Function, and Durability of Protective Ensembles and Ensemble Components+

WITHDRAWN published on 1.1.2010

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86.00 USD


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ASTM F1154-11 Historical

Standard Practices for Qualitatively Evaluating the Comfort, Fit, Function, and Durability of Protective Ensembles and Ensemble Components

WITHDRAWN published on 1.7.2011

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86.00 USD


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Entries shown from 79970 to 79980 out of a total of 92190 entries.


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