We need your consent to use the individual data so that you can see information about your interests, among other things. Click "OK" to give your consent.
Standard Test Method for Determining Variations in Hardness of Film Ribbon Pancakes
WITHDRAWN published on 10.2.1998
Selected format:Standard Test Method for Determining Variations in Hardness of Film Ribbon Pancakes
WITHDRAWN published on 27.5.1988
Selected format:Standard Test Method for Determining Variations in Hardness of Film Ribbon Pancakes (Withdrawn 2015)
WITHDRAWN published on 1.7.2008
Selected format:Standard Test Method for Dimensions of Notches on Silicon Wafers (Withdrawn 2003)
WITHDRAWN published on 10.1.2002
Selected format:Standard Test Method for Dimensions of Notches on Silicon Wafers
WITHDRAWN published on 10.1.2002
Selected format:Standard Test Method for Dimensions of Notches on Silicon Wafers
WITHDRAWN published on 10.1.2002
Selected format:Standard Test Method for Characterization of Metal-Oxide-Silicon (MOS) Structures by Capacitance-Voltage Measurements
WITHDRAWN published on 1.1.1992
Selected format:Standard Test Method for Characterization of Metal-Oxide-Silicon (MOS) Structures by Capacitance-Voltage Measurements (Withdrawn 2003)
WITHDRAWN published on 15.5.1992
Selected format:Standard Practices for Qualitatively Evaluating the Comfort, Fit, Function, and Durability of Protective Ensembles and Ensemble Components+
WITHDRAWN published on 1.1.2010
Selected format:Standard Practices for Qualitatively Evaluating the Comfort, Fit, Function, and Durability of Protective Ensembles and Ensemble Components
WITHDRAWN published on 1.7.2011
Selected format:Latest update: 2026-08-21 (Number of items: 2 298 377)
© Copyright 2026 NORMSERVIS s.r.o.