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Standard Test Method for Generation Lifetime and Generation Velocity of Silicon Material by Capacitance-Time Measurements of Metal-Oxide-Silicon (MOS) Capacitors (Withdrawn 2003)
WITHDRAWN published on 1.1.2000
Selected format:Standard Test Methods for Photoluminescence Analysis of Single Crystal Silicon for III-V Impurities (Withdrawn 2003)
WITHDRAWN published on 10.6.2000
Selected format:Standard Specification for Wrought 18 Chromium-14 Nickel-2.5 Molybdenum Stainless Steel Sheet and Strip for Surgical Implants (UNS S31673)
WITHDRAWN published on 10.6.2000
Selected format:Standard Specification for Wrought 18 Chromium-14 Nickel-2.5 Molybdenum Stainless Steel Sheet and Strip for Surgical Implants (UNS S31673)
WITHDRAWN published on 10.6.2003
Selected format:Standard Specification for Wrought 18Chromium-14Nickel-2.5Molybdenum Stainless Steel Sheet and Strip for Surgical Implants (UNS S31673)
WITHDRAWN published on 1.2.2008
Selected format:Standard Specification for Wrought 18Chromium-14Nickel-2.5Molybdenum Stainless Steel Sheet and Strip for Surgical Implants (UNS S31673)
WITHDRAWN published on 1.10.2012
Selected format:Standard Test Method for Measuring Warp on Silicon Wafers by Automated Noncontact Scanning (Withdrawn 2003)
WITHDRAWN published on 10.12.2002
Selected format:Standard Test Method for Measuring Warp on Silicon Wafers by Automated Noncontact Scanning
WITHDRAWN published on 10.6.1997
Selected format:Standard Test Method for Substitutional Atomic Carbon Content of Silicon by Infrared Absorption (Withdrawn 2003)
WITHDRAWN published on 10.6.2000
Selected format:Standard Test Method for Determining Net Carrier Density Profiles in Silicon Wafers by Capacitance-Voltage Measurements With a Mercury Probe
WITHDRAWN published on 10.6.2000
Selected format:Latest update: 2026-08-19 (Number of items: 2 298 207)
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