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Preview ASTM F1465-99 10.1.1999 Preview of the standard
ASTM F1465-99 Historical

Standard Guide for Selection of Operational Security Control Systems

WITHDRAWN published on 10.1.1999

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Preview ASTM F1466-20 1.9.2020 Preview of the standard
ASTM F1466-20 Historical

Standard Specification for Iron-Nickel-Cobalt Alloys for Metal-to-Ceramic Sealing Applications (Withdrawn 2024)

WITHDRAWN published on 1.9.2020

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Preview ASTM F1466-99 10.1.1999 Preview of the standard
ASTM F1466-99 Historical

Standard Specification for Iron-Nickel-Cobalt Alloys for Metal-to-Ceramic Sealing Applications

WITHDRAWN published on 10.1.1999

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Preview ASTM F1466-99(2005) 1.1.2005 Preview of the standard
ASTM F1466-99(2005) Historical

Standard Specification for Iron-Nickel-Cobalt Alloys for Metal-to-Ceramic Sealing Applications

WITHDRAWN published on 1.1.2005

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Preview ASTM F1466-99(2010) 1.10.2010 Preview of the standard
ASTM F1466-99(2010) Historical

Standard Specification for Iron-Nickel-Cobalt Alloys for Metal-to-Ceramic Sealing Applications

WITHDRAWN published on 1.10.2010

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Preview ASTM F1466-99(2015) 1.7.2015 Preview of the standard
ASTM F1466-99(2015) Historical

Standard Specification for Iron-Nickel-Cobalt Alloys for Metal-to-Ceramic Sealing Applications

WITHDRAWN published on 1.7.2015

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Preview ASTM F1467-11 1.10.2011 Preview of the standard
ASTM F1467-11 Historical

Standard Guide for Use of an X-Ray Tester (approximately equal10 keV Photons) in Ionizing Radiation Effects Testing of Semiconductor Devices and Microcircuits

WITHDRAWN published on 1.10.2011

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Preview ASTM F1467-18 1.3.2018 Preview of the standard
ASTM F1467-18 Historical

Standard Guide for Use of an X-Ray Tester (approximately equal10 keV Photons) in Ionizing Radiation Effects Testing of Semiconductor Devices and Microcircuits

WITHDRAWN published on 1.3.2018

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Preview ASTM F1467-99 10.1.1999 Preview of the standard
ASTM F1467-99 Historical

Standard Guide for Use of an X-Ray Tester ([approximate]10 keV Photons) in Ionizing Radiation Effects Testing of Semiconductor Devices and Microcircuits

WITHDRAWN published on 10.1.1999

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Preview ASTM F1467-99(2005) 1.1.2005 Preview of the standard
ASTM F1467-99(2005) Historical

Standard Guide for Use of an X-Ray Tester ([approximate]10 keV Photons) in Ionizing Radiation Effects Testing of Semiconductor Devices and Microcircuits

WITHDRAWN published on 1.1.2005

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