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Standard Test Method for Majority Carrier Concentration in Semiconductors by Measurement of Wavenumber or Wavelength of the Plasma Resonance Minimum (Withdrawn 2003)
WITHDRAWN published on 15.5.1992
Selected format:Standard Test Method for Thickness of Heteroepitaxial or Polysilicon Layers (Withdrawn 2002) (Includes all amendments And changes 2/18/2021).
WITHDRAWN published on 10.12.2000
Selected format:Standard Specification for Carbonized Nickel Strip and Carbonized Nickel-Plated and Nickel-Clad Steel Strip for Electron Tubes
WITHDRAWN published on 10.12.1999
Selected format:Standard Specification for Carbonized Nickel Strip and Carbonized Nickel-Plated and Nickel-Clad Steel Strip for Electron Tubes (Withdrawn 2010)
WITHDRAWN published on 1.1.2005
Selected format:Method for Preparing Monocrystalline Test Ingots of Silicon by the Vertical-Pulling (Czochralski) Technique (Withdrawn 1988)
Selected format:Standard Consumer Safety Specification for Lighters
WITHDRAWN published on 10.9.2000
Selected format:Standard Consumer Safety Specification for Lighters
WITHDRAWN published on 1.9.2004
Selected format:Standard Consumer Safety Specification for Lighters
WITHDRAWN published on 1.5.2010
Selected format:Standard Consumer Safety Specification for Lighters
WITHDRAWN published on 1.5.2019
Selected format:Standard Consumer Safety Specification for Lighters
WITHDRAWN published on 1.8.2020
Selected format:Latest update: 2026-06-30 (Number of items: 2 285 193)
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