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ASTM F521-83(2004) Historical

Standard Test Methods for Bond Integrity of Transparent Laminates

WITHDRAWN published on 1.10.2004

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86.00 USD


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ASTM F521-83(2010) Historical

Standard Test Methods for Bond Integrity of Transparent Laminates

WITHDRAWN published on 1.5.2010

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86.00 USD


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ASTM F522-94 Historical

Test Method for Stacking Fault Density of Epitaxial Layers of Silicon by Interference-Contrast Microscopy (Withdrawn 1998)

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77.00 USD


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ASTM F523-02 Historical

Standard Practice for Unaided Visual Inspection of Polished Silicon Wafer Surfaces (Withdrawn 2003)

WITHDRAWN published on 10.12.2002

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86.00 USD


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ASTM F523-93(1997) Historical

Standard Practice for Unaided Visual Inspection of Polished Silicon Wafer Surfaces

WITHDRAWN published on 10.12.1997

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86.00 USD


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ASTM F524-77(1992) Historical

Test Methods for Measuring Beam Divergence of Pulsed Lasers by the Apertured-Detector Technique (Withdrawn 2001)

WITHDRAWN published on 1.1.1992

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86.00 USD


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ASTM F525-00a Historical

Standard Test Method for Measuring Resistivity of Silicon Wafers Using a Spreading Resistance Probe (Withdrawn 2003) (Includes all amendments And changes 8/16/2017).

WITHDRAWN published on 10.12.2000

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96.00 USD


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ASTM F526-11 Historical

Standard Test Method for Measuring Dose for Use in Linear Accelerator Pulsed Radiation Effects Tests

WITHDRAWN published on 1.1.2011

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96.00 USD


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ASTM F526-16 Historical

Standard Test Method for Using Calorimeters for Total Dose Measurements in Pulsed Linear Accelerator or Flash X-ray Machines

WITHDRAWN published on 1.6.2016

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96.00 USD


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ASTM F526-97 Historical

Standard Test Method for Measuring Dose for Use in Linear Accelerator Pulsed Radiation Effects Tests

WITHDRAWN published on 1.1.1991

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96.00 USD


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Entries shown from 88620 to 88630 out of a total of 91752 entries.


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