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Preview ASTM F532-81(1987)e1 1.1.1987
ASTM F532-81(1987)e1 Historical

Test Methods for Measuring Width of Defects in Optical Surfaces, Using Nomarski Differential Microscopy (Includes all amendments And changes 8/13/2021).

WITHDRAWN published on 1.1.1987

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Preview ASTM F533-02 10.1.2002 Preview of the standard
ASTM F533-02 Historical

Standard Test Method for Thickness and Thickness Variation of Silicon Wafers

WITHDRAWN published on 10.1.2002

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Preview ASTM F533-02a 10.12.2002 Preview of the standard
ASTM F533-02a Historical

Standard Test Method for Thickness and Thickness Variation of Silicon Wafers (Withdrawn 2003) (Includes all amendments And changes 8/16/2017).

WITHDRAWN published on 10.12.2002

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Preview ASTM F533-96 10.1.2002 Preview of the standard
ASTM F533-96 Historical

Standard Test Method for Thickness and Thickness Variation of Silicon Wafers

WITHDRAWN published on 10.1.2002

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Preview ASTM F534-02 10.1.2002 Preview of the standard
ASTM F534-02 Historical

Standard Test Method for Bow of Silicon Wafers

WITHDRAWN published on 10.1.2002

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Preview ASTM F534-02a 10.12.2002 Preview of the standard
ASTM F534-02a Historical

Standard Test Method for Bow of Silicon Wafers (Withdrawn 2003) (Includes all amendments And changes 8/16/2017).

WITHDRAWN published on 10.12.2002

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Preview ASTM F534-97 10.1.2002 Preview of the standard
ASTM F534-97 Historical

Standard Test Method for Bow of Silicon Wafers

WITHDRAWN published on 10.1.2002

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Preview ASTM F535-79 1.1.1900
ASTM F535-79 Historical

Specification for Electrical Performance Characteristics of Vacuum Cleaners (Withdrawn 1985)

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Preview ASTM F535-79e1 1.1.1979
ASTM F535-79e1 Historical

Specification for Electrical Performance Characteristics of Vacuum Cleaners (Includes all amendments And changes 8/13/2021).

WITHDRAWN published on 1.1.1979

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Preview ASTM F536-98 10.12.1998 Preview of the standard
ASTM F536-98 Historical

Standard Test Method for Size of Resilient Floor Tile by Dial Gage Method (Withdrawn 2004)

WITHDRAWN published on 10.12.1998

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