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Standard Specification for Carbon and Alloy Steel Externally Threaded Metric Fasteners
WITHDRAWN published on 10.12.1998
Selected format:Classification for Filterability Index of Reagent-Grade Water and High-Purity Waters for Microelectronic Device Processing (Withdrawn 1989)
Selected format:Classification for Filterability Index of Reagent-Grade Water and High-Purity Waters for Microelectronic Device Processing (Includes all amendments And changes 8/13/2021).
WITHDRAWN published on 1.1.1982
Selected format:Method of Concentrating and Measuring Trace Quantities of Copper in High-Purity Water Used in the Electronics Industry (Withdrawn 1988)
Selected format:Method of Concentrating and Measuring Trace Quantities of Copper in High-Purity Water Used in the Electronics Industry (Includes all amendments And changes 8/13/2021).
WITHDRAWN published on 1.1.1980
Selected format:Test Method for Transistor Collector-Emitter Saturation Voltage (Withdrawn 1995)
Selected format:Standard Practice for Installation of Exit Devices in Security Areas (Includes all amendments And changes 8/16/2017).
WITHDRAWN published on 1.1.2001
Selected format:Standard Practice for Installation of Exit Devices in Security Areas
WITHDRAWN published on 1.1.2001
Selected format:Standard Practice for Installation of Exit Devices in Security Areas
WITHDRAWN published on 1.10.2008
Selected format:Standard Practice for Installation of Exit Devices in Security Areas
WITHDRAWN published on 1.2.2016
Selected format:Latest update: 2026-06-26 (Number of items: 2 284 409)
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