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Standards ASTM - American technical standards - Page 7571
ASTM – The company, ASTM International, belongs to the largest independent worldwide companies that deal with the development of standards, they are a reliable source of technical standards for materials, products, systems and services. ASTM International standards are known for their high technical quality and market relevancy and that is why they have an important role in the information infrastructure, which conducts projecting, manufacturing and trade in global economy. ASTM publishes standards dealing with metals, combustibility, chemical products, lubricants, fossil fuels, textiles, paints, rubber, piping, forensic sciences, electronics, energetic industry, medical devices and many other subjects.
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ASTM F139-00
Historical
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Standard Specification for Wrought 18 Chromium-14 Nickel-2.5 Molybdenum Stainless Steel Sheet and Strip for Surgical Implants (UNS S31673)
WITHDRAWN published on 10.6.2000
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ASTM F139-03
Historical
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Standard Specification for Wrought 18 Chromium-14 Nickel-2.5 Molybdenum Stainless Steel Sheet and Strip for Surgical Implants (UNS S31673)
WITHDRAWN published on 10.6.2003
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ASTM F139-08
Historical
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Standard Specification for Wrought 18Chromium-14Nickel-2.5Molybdenum Stainless Steel Sheet and Strip for Surgical Implants (UNS S31673)
WITHDRAWN published on 1.2.2008
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ASTM F139-12
Historical
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Standard Specification for Wrought 18Chromium-14Nickel-2.5Molybdenum Stainless Steel Sheet and Strip for Surgical Implants (UNS S31673)
WITHDRAWN published on 1.10.2012
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ASTM F1390-02
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Standard Test Method for Measuring Warp on Silicon Wafers by Automated Noncontact Scanning (Withdrawn 2003)
WITHDRAWN published on 10.12.2002
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ASTM F1390-97
Historical
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Standard Test Method for Measuring Warp on Silicon Wafers by Automated Noncontact Scanning
WITHDRAWN published on 10.6.1997
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ASTM F1391-93(2000)
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Standard Test Method for Substitutional Atomic Carbon Content of Silicon by Infrared Absorption (Withdrawn 2003)
WITHDRAWN published on 10.6.2000
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ASTM F1392-00
Historical
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Standard Test Method for Determining Net Carrier Density Profiles in Silicon Wafers by Capacitance-Voltage Measurements With a Mercury Probe
WITHDRAWN published on 10.6.2000
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ASTM F1392-02
Historical
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Standard Test Method for Determining Net Carrier Density Profiles in Silicon Wafers by Capacitance-Voltage Measurements With a Mercury Probe (Withdrawn 2003)
WITHDRAWN published on 10.12.2002
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ASTM F1393-02
Historical
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Standard Test Method for Determining Net Carrier Density in Silicon Wafers by Miller Feedback Profiler Measurements With a Mercury Probe (Withdrawn 2003)
WITHDRAWN published on 10.12.2002
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